Reliability Analysis for VLSI Electronic Systems
نویسندگان
چکیده
The standard methods used for analysing the reliability of electronic systems are unsuited to VLSI systems because of their large-scale and software-driven nature. In this paper, a review of the problems is presented together with an analysis of the difficulties encountered in extrapolation of the present techniques. Some proposals are presented with the intention of making the solution more manageable for this type of problem. Early results are given to suggest how the approach may develop.
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